【作者】 郭红英；

【导师】 祖静；

【作者基本信息】 中北大学 ， 测试计量技术及仪器， 2007， 硕士

【摘要】 本文主要讨论了存储测试专用集成电路的检测。对专用集成电路的功能、研制的意义以及专用集成电路的国内外现状进行了较为详细的介绍。文中提出了一种模拟数字混合、计算机人机交互的检测方法,根据ASIC的各功能模块,建立了相应的ASIC芯片的成测方案。在检测系统设计部分讨论了如适配器的设计、频率检测模块的设计等,同时对检测系统的软件进行了分析设计。在检测部分对集成电路的检测作了说明,利用设计的检测系统按照检测步骤对专用集成电路的全部参数成功进行了检测。文中还介绍了数字专用集成电路在存储测试领域的应用。对利用专用集成电路的存储测试系统进行了包括电荷放大器、模拟滤波器、电路抗干扰等的设计。采用专用集成电路HB0201设计的存储测试系统能独立地完成动态数据采集与存储记忆,能在多种恶劣环境及高难度的存储测试环境中使用。专用集成电路的使用减小了测试装置体积,降低了系统功耗,提高了测试系统的可靠性。HB0201与HB0202的研制提高了存储测试技术的水平,具有很高的实用价值。此外,本论文还对使用CPLD器件作为存储测试系统的控制器进行了探讨,比较了两者的优缺点,介绍了今后研究的方向。更多还原

【Abstract】 This paper mainly discusses the test of digital ASIC. The function of research on ASIC、its function and domestic and international state are introduced respectively. An analog-digital, human-computer interactive method of testing and measuring is proposed in this paper, measuring scheme of ASIC products is built. In test system design section, the design of adapter is discussed. In the meantime, the software used for test system is analyzed in the section. The test of ASIC is explained in test section. By the test system, all parameters of the ASIC are tested according to the test procedure successfully. In addition, the aging experiment is adopted to improve the dependability of the chip with correct function. At the same time, the dependability is analyzed in theory.In this paper, the application of digital ASIC in the field of memory testing is also introduced. In the memory measurement system, the designs that include charge amplifier, analog filter, anti-jamming and so on are accomplished. The memory test system with HB0201 or HB0202 can effectively accomplish the sampling and memory of dynamic data independently. It can be used in various tough testing environments. The use of ASIC reduces the volume and power of tester, and moreover, its dependability is improved.In addition ,this paper research the way of using CPLD as control and compare their advantage with disadvantage .At same time, research directions are pointed out in this paper.更多还原