【作者】 姜帅；

【导师】 郭树旭；

【作者基本信息】 吉林大学 ， 电路与系统， 2006， 硕士

【摘要】 本文主要介绍了一个半导体激光器1 /f噪声虚拟测试及处理系统,重点在软件部分。首先对半导体激光器的噪声特性进行了综述,介绍了半导体激光器噪声测量的常用方法。然后是该系统的硬件部分,主要是用数据采集卡采集从测试盒中出来的待测信号。着重介绍的是针对1 /f噪声的小波消噪原理,以LabVIEW为平台,调用MATLAB程序进行消噪处理,并给出了消噪前后的对比图。之后,利用LabVIEW设计带小波消噪的虚拟频谱分析仪,对所采集的信号进行消噪和频谱分析,从而对器件的噪声特性进行判断。本论文的主要成果是实现了从混有白噪声的1 /f噪声中有效的提取出了1 /f噪声,并设计虚拟仪器对其进行处理和分析,充分利用了LabVIEW与MATLAB各自的优势,成本低廉。更多还原

【Abstract】 With the development of the optoelectronic technique, semiconductor lasers (LDs) are widely used in optical fiber communication, optical sensor, information memory, medical treatment and pumping solid lasers. With the expansion of the excitonic wavelength, Spectral characteristic’s improvement, the reducing of threshold current, the improvement of quantum transfer efficiency, the enhancement of output light power, the improvement of reliability etc, the superiority of the LD is more obvious. As a kind of important light source, the reliability of semiconductor lasers is imperative in all the applications. The study on the reliability of LDs and its regularity is very important to improve their specific property and use them rightly. At present, the usual method of screen is electric aging in which all devices are aged with a constant power or a constant current under high temperature and then the early failed devices are selected. In the aging, the reliable devices are also subject to screening, and the lifetime of devices is affected because of the hot and electric hurt. It can cause batches of devices damage when some accidence happens, for instance, the out of control system or power cut. On the other hand, electric aging is not sensitive for latent defects; for example, some devices after electric aging screening are usually found fail rapidly. Thus, the urgent problems are how to manufacture the high reliable devices, how to analyses the factors, which affect the device reliability, and how to select the unqualified devices with a fast, nondestructive and conveniently method. When LDs work, p-n junction voltage of it will tend to stochastic fluctuation, named electronic noise. Electric noise indicates the defect of material and更多还原