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压缩载荷下纳米尺度薄膜材料破坏机理的实验研究

An Experimental Study of the Failure Mechanism of Compressed Thin Films in Nanoscale

【作者】 董典帅

【导师】 王世斌;

【作者基本信息】 天津大学 , 固体力学, 2005, 硕士

【摘要】 微尺度力学和MEMS系统中的低维材料性能研究是当今国际多学科交叉研究的热门课题。涉及力学问题有薄膜材料在残余应力和外载荷作用下的变形、应力、断裂和屈曲等。薄膜材料的力学性能,尤其在纳米尺度上的力学性能的研究具有重大的学术价值和广阔的应用前景。在本文中,我们选择信息工程中使用的具有代表性的薄膜/基底组合形式:一类是钛/聚碳酸脂,另一类是钛/有机玻璃; 利用真空对靶磁控溅射镀膜技术制作了50-150纳米间不同厚度的薄膜。需精确设置仪器参数,如:初始压力(真空度)、工作压力和沉积速度等,这样才能精确控制薄膜的沉积厚度。本文定性分析了皱折屈曲传播的机理,进行了屈曲分层的数学分析:薄膜中屈曲分层的稳定增长条件,可以用一个简单的方法计算得来,前提条件是增长的前端部分不做要求。这种方法的准确程度,依赖于对沿着屈曲传播前端分布的载荷相角的估计精度设计了新的差动式机械---对中受压加力装置,对薄膜施加均匀的轴向载荷。基底的加工精度、薄膜的镀膜技术、加力装置的加工精度等都会影响实验的结果。在外加单向压缩应力和残余应力的联合作用下,研究了薄膜和基底之间由脱粘到屈曲,屈曲又驱动脱粘,进而散裂的全过程。用OLYMPUS显微镜对屈曲形成的过程进行了详细的观察,观察了皱折屈曲成长、传播的全过程,并且对不同应力下的屈曲尺寸作了标定。利用有限元软件Ansys模拟屈曲的形成过程; 特别是讨论不同屈曲结构共存的状态。

【Abstract】 The study about tiny scale mechanics and material performance in MEMS system today is a hot topic in the intercross investigation among many international subject . The mechanics behavior of membrane material under residual stress and compressive stress has been studied .Deformation,stress,fracture and buckle are involved.The mechanics behavior especially among nano scale is important and has widely application forground. In this paper we select the representative film and substrate combination.One is the combination of titanium and polysaccharide another is titanium and organic.We have samples with different thickness from 50 nanometer to 150 nanometer All the samples were deposited.During the deposition process we need to control many parameters which involve initial vacuum and work pressure and the speed of deposition.so that we can gain the exact thichness of film. In this paper we analyzed the mechanism of straight-sided bulking and the propagation of bulking driven delamintaion. Conditions for steady-state growth of buckling-driven delamination in thin film systems can be calculated by a simplified method where details around the growing front are not required. The simplified method relies upon estimates of the phase angle of loading along the propagation front of delamination. In this paper we have designed new compressive device.The film needs axial compressive stress .The acuuracy of experimental results relies on the machining of the substrate and the method of deposition.The machining accuracy of the compressive device can also affect the results. Under the condition of combination effect of axial compressive stress and residual stess we study the whole process from delamination to bulking .All the results can be gained by the use of OLYMPUS.We also observed the whole growing process of straighted-sided bulking .In this paper ,we measured the height of bulking under different stess and discussed the coexist of different bulking .In the end by the use of the ANSYS software we simulated the process of bulking .

【关键词】 屈曲分层薄膜失稳屈曲缺陷纳米尺度
【Key words】 Buckling-driven delaminationThin filminstabilitiesBucklingDefectnanoscale
  • 【网络出版投稿人】 天津大学
  • 【网络出版年期】2006年 06期
  • 【分类号】O346
  • 【下载频次】116
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