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高精度电荷校准仪的研究及动态测试专用集成电路的检测与应用
【作者】 张瑜;
【作者基本信息】 华北工学院 , 测试计量技术及仪器, 2004, 硕士
【摘要】 本文内容分为两篇,第一篇题目是高精度电荷校准仪的研究,第二篇题目是动态测试专用集成电路的检测与应用。第一篇在分析虚拟仪器技术和国内外电荷校准仪发展现状的基础上,对基于计算机并行口的虚拟高精度电荷校准仪进行了研究。文中基于电荷校准的原理及带限信号的抽样与重构理论,提出了采用直接数字合成技术与计算机技术的整体设计方案,详细讲述了硬件电路与系统软件的设计过程,并对高精度电荷校准仪输出信号的误差进行了理论分析。实验研究结果表明,本文提出的高精度电荷校准仪原理方案正确、可行,这种低成本的高精度电荷校准仪的性能已经超过目前国内外研制的同类产品的水平,已达到了课题的要求,它的研究具有重要的意义和实际应用价值。第二篇中介绍了动态测试专用集成电路HB0201与HB0202的研制背景及功能。提出了一种模拟数字混合、计算机人机交互的检测方法,建立了ASIC芯片的检测方案。最后简单介绍了HB0201与HB0202在存储测试系统中的应用情况。
【Abstract】 The paper consists of two parts, the first subject is the research on high precision charge calibrator, the other one is the measurement and application of the dynamic testing ASICs.In the first part, the virtual high precision calibrator communicating with computer through parallel port is researched based on the detailed analysis of virtual instrument technology and domestic and foreign technology of charge calibrator. Based on the theory of charge calibration and sample and reconstruction of frequency limited signal, the scheme of adopting direct digital synthesizing technology and technology of computer is put forward in the paper. The design of hardware and software is described in detail, the error of the outputs signals of the high precision charge calibrator has been analyzed in theory. The experiment result shows that the scheme is correct and feasible, and the quality of the low-cost high precision charge calibrator has exceed the level of like product both at home and abroad, which has meet the requirement of this subject. The research on high precision charge calibrator is significant and valuable. In the second part, the research background and function of dynamic testing ASIC HB0201 and HB0202 is introduced. An analog-digital, computer-interactive method of testing and measuring is proposed, measuring scheme of ASIC products is built. Finally, the paper simple introduces the application of HB0201 and HB0202 in memorized testing system.
【Key words】 Charge Calibrator; Waveform Generator; Direct Digital Synthesis; Virtual Instrument; Application Specific Integrated Circuit; Dynamic testing;
- 【网络出版投稿人】 华北工学院 【网络出版年期】2004年 03期
- 【分类号】TN407
- 【被引频次】3
- 【下载频次】194