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基于ARM的智能继电器测试系统的设计与研究

Design and Research on Smart Relay Measuring System Base on ARM

【作者】 冯晓

【导师】 郁进明;

【作者基本信息】 东华大学 , 通信与信息系统, 2010, 硕士

【摘要】 继电器在国民经济各领域内,特别是在工业控制中占有重要的地位,其可靠性直接影响到这些领域的发展,能否准确及时地工作是判断其可靠性的重要指标,触点的断开和闭合以及接触状态的好坏可以通过分析触头两端的电压来获得,这也是大多数继电器可靠性试验装置的重要测试项目。本文设计了基于ARM的智能继电器测试系统。首先,文章全面深入地对电磁继电器的工作原理和应用范围进行了分析,重点对继电器的主要参数:吸合/释放电压、吸合/释放时间、触点电阻和线圈电阻进行了测试原理的剖析。设计了一种基于ARMCortex为内核的智能继电器测试系统。对于不同的测试参数,该系统可以通过集成切换网络进行模块切换。针对不同的参数测试,该系统分别设置了各自的测试流程,并结合软硬件实现各参数的测试过程。在软件平台上,本系统选择了IAR软件平台和LabVIEW程序开发环境,IAR集成平台C-SPY方式的J-LINK仿真器可以实现JTAG方式的无缝链接,同时可以支持ARM模式下的编译。而LabVIEW的程序开发环境用于上位机PC控制界面的设计。通过在LabVIEW的界面,可以对测试参数的上下限数值进行控制,同时测试完毕的参数可以返回PC在界面上显示。最后,在完成了软硬件设计的基础上,对系统进行了实验和测试,实际测试结果和预计结果基本一致,能够对继电器的参数进行可准确的测试。本系统是对继电器多参数集总式测试的一种可行的方法,可以大幅度地节约成本,具有一定的经济价值和市场前景。

【Abstract】 Relay plays an important role in various fields of national economy, especially in industry control board. For a relay, whether it can work well and truly is an important guide line to its reliability. The contacts act right or not can be decided by analyzing the contact voltage drop of relay, which is a key test item in most relay reliability examination equipment. With the development of science and technology, various examination methods take place. In this article, a new test smart system based on ARM is introduced.At the beginning of this paper, the working principle and application of electromagnetic relay is analyzed in depth. The main parameters of the relay are studied by test principle, as such pick-up / release voltage and time, shock resistance, coil resistance. A novel smart relay testing system based on ARM Cortex kernel is designed.On software platform, the system selected the 1AR software platform and LabVIEW program development environment, IAR integration platform C-SPY mode of J-LINK emulator can achieve a seamless link and support the ARM mode to compile. The LabVIEW program development environment is used to design the host computer PC control interface. The LabVIEW interface can control upper and lower limits values of test parameters, and display the results of test parameters.Finally, this proposed system is tested based on software and hardware design. The results show that actual test results and expected results are basically consistent, and the system has accurately test for relay parameters. The platform is a new viable solution for multi-parameter set of relays, and it can be significant cost savings with high economic value and market prospects.

【关键词】 继电器智能继电器测试系统ARM CortexIARLabVIEW
【Key words】 RelaySmart relay test systemARM CortexIARLabVIEW
  • 【网络出版投稿人】 东华大学
  • 【网络出版年期】2010年 08期
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