【作者】 葛国库；

【导师】 李春芳；

【作者基本信息】 中国科学院研究生院（西安光学精密机械研究所） ， 光学工程， 2008， 硕士

【摘要】 古斯-汉欣位移在光通信、近场光学探测等领域中具有十分重要的地位。在单一界面上,全反射光束的古斯-汉欣位移不足一个波长,很难进行测量,从而阻碍了它在实际中应用。近年来,古斯-汉欣位移的增强成为该领域研究的热点之一。本文首先介绍了有关古斯-汉欣位移的发展、现状及理论研究的主要方法——稳态相位法和能流法。在此基础上,用稳态相位法分别对镀介质膜的棱镜结构、单侧镀膜的对称双棱镜结构及增益介质膜结构中反射和透射光束的古斯-汉欣位移进行了理论分析,讨论了入射角变化、薄膜厚度变化及空隙宽度变化与古斯-汉欣位移变化的规律。研究发现,三种结构中的古斯-汉欣位移均随入射角或薄膜厚度变化而共振增强,可达几十甚至几百波长。在单侧镀膜的对称双棱镜结构中,若在入射侧棱镜的斜面上镀介质膜,反射光束的古斯-汉欣位移约为透射光束位移的一半;若在透射侧棱镜的斜面上镀介质膜,反射光束的古斯-汉欣位移在共振点附近为负位移。在弱增益介质膜结构中,可获得很大的负位移共振峰且易于测量。为了验证理论结果,用微波束入射薄膜增强结构,测量了反射微波束的古斯-汉欣位移,讨论了实验误差及应采取的措施。结果表明,对线偏振电磁波,理论结果与实验结果符合得很好。更多还原

【Abstract】 Goos-Hanchen (GH) Shift plays an important role in the field such as optical communication, near field measurement and so on. However, this shift of reflected light beam that occurs in a single-interface is less than one wavelength and difficult to measure. Therefore, its application is impeded for a long time. Recently, the enhancement of Goos-Hanchen Shift becomes one of the focus in this field. Firstly, the development, the main theoretical approachs such as the stationary phase method and the nenergy flux method are introduced. Based on the above description, the Goos-Hanchen shift of the refletected and transmitted light beam in the film-coated dielectric prism configuration, a single film-coated symmetric double-prism configuration and the weakly active dielectric film coated prism configuration is thoroughtly investigated by the stationary phase method. The dependence of the Goos-Hanchen shift on the incident angle, the thickness of thin film and the thickness of air gap is discussed separately. It is shown that the Goos-Hanchen shift of the discussed configuration are resonantly enhanced with respect to the incicent angle or the the thickness of the thin film, and its magnitude can be of one or two order of wavelength when the angle of incidence is larger than the critcal angle for total reflection at prism-vacuun interface and is small than but close to the critical angle for reflection at the prism-film interface. In the single film-coated symmetric double-prism configuration when the thin film is coated onto the surface of the first prism, the shift of transmitted beam is about half the shift of reflected beam. In the single film-coated symmetric double-prism configuration when the thin film is coated onto the surface of the second prism, the shift of reflected beam is negative near the resonant point. In the weakly active dielectric film-coated prism configuration, many resonant peak of the giant negative shift can be achieved and easiely measured. In order to varify the theoretical prediction, microwave experimental setup of the reflected beam shift is designed and the shift is measured. the experimental errors and the Means to reduce them is also discussed. For linear polarized microwave beam, The experimental measurements are in good agreement with theroretical calulations.更多还原