高压脉冲电容器贮存性能的研究

【作者】 叶海福；

【导师】 姚永和；

【作者基本信息】 中国工程物理研究院 ， 物理电子学， 2007， 硕士

【摘要】 高压脉冲电容器是某重要装置的关键元器件之一，其贮存性能的好坏直接关系到该装置的可靠性。而高压脉冲电容器与装置中的其他元器件相比，贮存稳定性差，贮存寿命短，是典型的短寿命器件。对于整个装置来说，高压脉冲电容器的贮存寿命直接影响到整个装置的使用寿命。因此，开展高压脉冲电容器贮存性能的研究就显得尤为重要。本文针对目前应用较为广泛的膜纸复合型高压脉冲电容器开展了长时间的贮存实验研究，初步掌握了高压脉冲电容器各种性能参数在自然贮存条件下的变化规律。在此基础上，对高压脉冲电容器电容量的变化趋势进行了研究，并对产生这种变化的原因进行了分析。使用灰色系统分析模型，对高压脉冲电容器性能参数的变化与贮存环境因子的关系进行了分析和评估，并使用灰色系统基本GM(1，1)模型对液体高压脉冲电容器电容量随贮存时间的变化趋势进行了预测。该模型具有较高的精度，其分析预测结果与实际监测的数据相吻合。针对高压脉冲电容器在贮存过程中出现绝缘性能下降和偶然击穿的特殊情况，本文对高压脉冲电容器进行了自然贮存和加速寿命实验，并跟踪监测其漏电流的变化趋势。实验结果表明，高压脉冲电容器在经过自然贮存或加速寿命实验之后，漏电流增加，整体绝缘性能下降，但是通过对17支贮存10年以上的液体高压脉冲电容器进行工作寿命考核，实验结果表明，作为短寿命器件的液体高压脉冲电容器在贮存6～10年以后依然能够满足正常工作的要求，这为重新认识和确定液体高压脉冲电容器的贮存寿命提供了十分有价值的参考依据和实验数据。此外，本文还讨论了基于局部放电的高压脉冲电容器绝缘检测方法，对固体高压脉冲电容器进行了加速寿命实验，并通过检测其局部放电的变化研究电容器的绝缘性能变化规律。根据局部放电检测结果，从不同的角度对固体高压脉冲电容器的局部放电指纹特征进行了多参数提取。实验结果表明，高压脉冲电容器直流局部放电检测能很好的反映电容器内部局部放电发生的激烈程度，处于不同绝缘状态的高压脉冲电容器局部放电的参数存在明显的差异，但局部放电特征的提取和分析还需要开展深入研究。更多还原

【Abstract】 The high voltage pulse capacitor is the key part of one high voltage apparatus. Compared with the other part of the apparatus, the parameters of high voltage pulse capacitor vary sharply in the long storage time. So this high voltage apparatus reliability rests on the performance of the high voltage pulse capacitor greatly. Thus it’s important to do some research on the stability of high voltage pulse capacitor.The chief aim of present work is to investigate the long storage feature of high voltage pulse capacitor. Based on the long-term storage experiment data, several conclusions are made by the author. The relationships between the parameters of high voltage pulse capacitor and different environment are analyzed by using the grey system model. In addition, the long-term storage parameter of high voltage pulse capacitor are predicted by using basic GM(1,1) ]’model. Compared with the actual value, it’s indicated that the constructed model is of good precision and the grey system theory is simple and practical for engineering application.The experiment being made by our research group is aimed at obtaining the result of insulation status by long-term storage and stepped-aging. The method used in our study is known as measuring electric current and partial discharge under the high voltage of direct current. The results of the experiment indicate that long-term storage and stepped-aging deteriorate the capacitor’s insulation. However, several capacitors which are stored for more than 10 years could work correctly under rating voltage. These results provide the valuable approach and technology experience for confirming the storage life of the high voltage pulse capacitor. In addition, the partial discharge feature of testing is extracted in accordance with statistical theory, which is processed and recognized by Matlab and other statistical software. At the same time, the primary test effects are introduced.更多还原