【作者】 陈国强；

【导师】 张维强；

【作者基本信息】 南京农业大学 ， 机械设计及理论， 2007， 硕士

【摘要】 产品几何技术规范(GPS)是国际上最具影响力的基础标准与计量信息体系，是制造业信息化、质量管理、工业自动化系统与集成等工作的基础。基于GPS体系，开展各项基础研究、实用转化以及进行相关标准的研究与制订，具有实际的意义。本文首先阐述了新一代GPS体系的框架和发展动态，总结分析当今国内外对表面微观形貌的表征和评定现状，指出表面微观形貌的表征和评定是GPS体系中的重要组成部分。基于新一代GPS通用标准矩阵模型，系统地分析了当前GPS体系中二维形貌的表征参数和评定标准，总结分析了中线法、MOTIF法等二维表征方法以及相应二维评定基准线的确定，比较了其优缺点及应用现状。当今国际上对表面微观形貌三维表征还处于研究探索阶段，分析了三维表征的研究现状和发展方向，研究了使用高斯滤波方法确定表面三维表征评定基准面的数学模型，详细分析比较了ISO／TC213最新提出的Areal表征参数和欧共体提出的14+3参数体系，结合GPS标准体系的实用原则选取一套Areal表征参数体系，建立了表征参数与表面性能的对应关系，并探讨性地提出了表征参数选取的原则与方法。在分析了表面形貌的各种测量方法之后，阐述了原子力显微镜(AFM)的基本原理，运用AFM提取两种加工精度不同的研磨表面形貌信息，对所获取的表面形貌信息进行表面重构并对其滤波处理，得到表面的高斯评定基准面，在此基础上算出相应Areal表征参数值，并进行对比，结果表明Areal幅度参数和综合参数随表面形貌不同反应敏感，功能参数比较稳定，研磨工件表面形貌特性随着加工精度的提高趋向高斯分布，精密磨削加工的表面形貌适合使用高斯滤波分析。实验也表明原子力显微镜非常适合测量精加工表面的三维表面形貌，可以作为进行GPS体系研究的重要测量工具。更多还原

【Abstract】 Geometrical Product Specification and verification (GPS) standard system is the most fundamental standard system in the world and the foundation of quality management and automatization integrated system for the manufacturing industry. It is very necessary to conduct the research on the characterization technique of surface topography based on general matrix mode of novel GPS system, such as theoretical study, applied transition and standard development.In this dissertation, the framework and the development trends of novel GPS system are studied, the current characterization and assessment methods of surface microtopography are analyzed, and then it is pointed out that the characterization and assessment of surface microtopgraphy is one of the important parts of the GPS system. The current characterization parameters and standards of 2D microtopgraphy are investigated. The 2D roughness characterization methods such as based on middle line and Motif method are studied, and then their strongpoint and shortpoint are studied.The 3D characterization of surface microtopography is still on road now, the current work and development trends are researched, and the mathmold of Gaussian filter are studied and built. The Areal parameters of ISO/TC213 N756 and 14+3 parameters system used by Europe community are studied, a group of parameters under these two systems above and based on GPS system’s principle are selected, the relationship between assessment parameters and surface functions are analyzed. Then a method and principle of select parameters for characterizes the surface mircotopography are discussed.After the analysis of all kinds of measurement for surface topography, the principium of atomic force microscope (AFM) are illustrated, then AFM be used to measure the lapped finishing part so as to got the information of surface topography, then reshaped the surface information and deal with Gaussian filter so as to got the assessment foundation, based on the research above, the Areal parameters are calculated and compared. The result showed that the amplitude parameters and hybrid parameters are sensitive and the function parameters is steady, at the same time it is discovered that the surface of lapped finishing part tend to Gaussian distribute, so that the Gaussian filter is fit for lapped finishing part surface’s analysis. The experiment also showed that the AFM is a excellent measure instrument of GPS’s study work, it’s especially for the high precise surface topography.更多还原