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基于DSP的高速模数转换器动态测试技术研究

The Study about Dynamic Test Technology of High-Speed-ADC Based on DSP

【作者】 许弟建

【导师】 徐世六;

【作者基本信息】 重庆大学 , 微电子与固体电子, 2007, 硕士

【摘要】 高速模数转换器(ADC)被广泛应用于视频、无线通讯、军事等领域,其应用需求量较大,生产单位为能高效率生产出性能指标合格的高速ADC,如何快速准确评估高速ADC的性能就显得十分的重要。ADC测试方法分为静态测试法和动态测试法。采用传统的静态测试法进行ADC转换特性参数测试,难于真实、完整的表征ADC的动态性能。为了更好的评估ADC的性能,目前国内外主要采用的是基于DSP的码密度直方图分析法和频域动态分析法等动态测试技术。本文作者在大量阅读国内外高速ADC性能测试方法的基础上,对码密度直方图理论、频域动态分析理论、窗函数技术、相干采样技术和高速ADC测试方法等进行了较深入的分析研究。根据国内外目前对高速ADC的测试现状,特别是国内测试硬件缺乏,测试方法落后的现实,结合高速ADC动态测试平台的预研工作,利用PC机、DSP芯片和FIFO芯片,设计和搭建了一套操作简易的ADC动态测试平台,完成了硬件设计和调试以及相关测试软件编程等工作,初步实现了对高速ADC的动态测试。利用该测试平台,对两类高速ADC(10位的AD9050和8位的AD9480)实现了50MHz以内的码密度直方图分析法测试和频域动态分析法测试。从测试结果看,该平台方案可行且操作简单,适合对高速ADC芯片的性能评估。

【Abstract】 High-speed analog-to-digital converters (ADC) are widely applied in video、wireless communication and military arena etc.They have quite a number of application demands.In order to manufacture efficiently high-speed ADC that has good performance,how to evaluate the performance of high-speed ADC accurately and quickly is very important.ADC testing includes static testing and dynamic testing.It is difficult to evaluate the dynamic performances of high-speed ADC truely and completely to adopt tranditional static-testing methods.In order to test and access the high-speed ADC,the dynamic testing methods based on digital signal processing(DSP) such as the code density histogram analytic method and frequency-field dynamic analytic method are adopted widely at home and overseas.After reading lots of high-speed ADC performance testing methods ,the author deeply analyzes and studies code density histogram theory、frequency-field analytic theory、window function technique、coherent sampling technique and high-speed ADC testing methods etc.According to testing status at home and overseas,especially lack of hardware and lag of testing technique at home,combining with pre-studying high-speed ADC dymamic testing station ,the author designs and builds a suit of high-speed ADC dynamic testing station that can be operated easily based on PC、DSP、FIFO,realizes preliminarily dynamic testing to high-speed ADC.Using this dymamic testing station,two types of high-speed ADC that are 10_bit AD9050 and 8_bit AD9480 are tested by the code density histogram analytic method and frequency-field dynamic analytic method below 50 MHz. Test results indicate this design strategy is feasible and portable.It is very fit for performance testing of high-speed ADC chip in the project assess.

  • 【网络出版投稿人】 重庆大学
  • 【网络出版年期】2007年 05期
  • 【分类号】TN792
  • 【被引频次】4
  • 【下载频次】420
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