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掺Er:Al2O3和掺Er:nc-Si/SiO2材料的制备与表征

Preparation and Characterization of Er-Doped Al2O3 Films and Er-Doped nc-SiO2 Films

【作者】 肖海波

【导师】 邹世昌; 张峰;

【作者基本信息】 中国科学院研究生院(上海微系统与信息技术研究所) , 微电子与固体电子学, 2004, 硕士

【摘要】 随着全光网络和光子集成技术的发展,掺铒光波导放大器(EDWA:Er Doped Waveguide Amplifier)作为较新的研究领域,正在受到越来越多科研工作者的重视。本论文采用离子束辅助沉积和离子注入法开展了掺Er:Al2O3薄膜和掺Er:nc-Si/SiO2材料的研究。 实验采用离子束辅助沉积和离子注入法制备了掺铒Al2O3薄膜,研究了不同退火温度下,样品的成分、结构、表面形貌和化学价态。随退火温度的升高,Er离子被激活,样品的光致发光强度随退火温度升高而上升。样品在700℃退火下,折射率和粗糙度都达到最小值,影响了透射谱中此样品的透射峰强度和光吸收损耗,并影响了光致发光谱。论文对材料发光机理进行了一些探讨。有关微观结构的具体变化,及对材料光致发光机理的影响需要系统的研究。实验还采用Xe离子轰击的方法制备了非晶的Al2O3薄膜,研究了轰击对样品表面形貌的影响。 论文还利用离子注入方法制备了纳米颗粒直径为2~4nm的nc-Si/SiO2材料,制备的Si纳米晶颗粒周围分布着大量的非晶硅。随退火温度升高,非晶硅层减少,晶化加强。 论文制备了掺铒nc-Si/SiO2材料。研究了材料的微观结构,并测量了样品的光致发光谱,研究了材料的微观结构和掺Er后材料发光强度随测量温度的变化。实验对材料的发光机理进行了深入的探讨,发现存在于非晶氧化硅及其界面上的光激活Er离子,通过非晶硅与纳米硅相耦合,非晶硅的存在影响了纳米硅与Er离子间的能量传递,对Polman等人的纳米硅与Er的强耦合模型提出了改进。 最后,论文初步开展了联合沉积法制备掺Er薄膜材料的工作。

【Abstract】 With the development of optical communication and integrated optoelectronics, Er Doped Waveguide Amplifier (EDWA) has become the hotspot in the field of optical fiber communication and optoelectronics. We prepared Er-doped Al2O3 Films and Er-doped nc-SiO2 Films, and studied their characterization.Er-doped Al2O3 Films were prepared by Ion Beam Enhanced Deposition (IBED) and Ion Implantation. After different annealing temperature, we examined the composition, surface morphology, structure and chemical value. Er3+ ions were activated gradually and photoluminescence intensity increased with the annealing temperature. Annealed at 700℃, refractive index and surface roughness reached the least, which affected optical transmission spectra, optical absorption loss, and photoluminescence intensity. This thesis discussed the PL mechanism.We also prepared Er-doped nc-SiO2 Films by Ion Implantation. After different annealing temperature, the microstructure and photoluminescence were investigated. We discussed the PL mechanism in-depth, and made conclusions that Er ions lied in amorphous Si and coupled with nc-Si through a-Si, which affected the energy transfer from nc-Si to Er. We ameliorated Polman’s model.Finally, the paper developed the co-sputtering technology to prepare Er-doped films.

  • 【分类号】TN304
  • 【下载频次】127
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