【作者】 赵岩岭；

【导师】 鲁昌华；

【作者基本信息】 合肥工业大学 ， 信号与信息处理， 2004， 硕士

【摘要】 随着微处理器技术及微电子技术的迅猛发展，电路系统的规模和复杂性都急剧上升，印刷电路板的密度不断增加，使得电路系统的测试难度也越来越大。而数模混合电路的广泛应用给现有的测试方法也提出了新的挑战，其可测试性问题成为一个重要的研究课题。本文运用离散事件系统理论(Discrete EventSystem, DES)来进行数模混合电路的可测试性分析，提供了一种对数字电路、模拟电路及数模混合电路测试统一的处理方法。 本文的主要工作及取得的成果如下： 文中系统研究了运用离散事件系统理论测试数模混合电路的数学模型，并验证了其可行性，这样数字电路和模拟电路就能够在一个统一的框架内进行可测试性分析及故障诊断。 在采用DES理论分析数模混合电路时，其中一个重要工作就是求取电路的 最小测试集，以达到减少测试时间、降低测试成本的目的。本文提出将其看作一个组合优化问题，并运用遗传算法和模拟退火算法相结合的混合优化策略来解决，通过编程实现了该算法，达到了同时求取多个最小测试集的效果。 本文针对建立被测电路的DES模型问题，采用EDA工具Multisim2001软件来对被测电路注入故障，进行故障仿真，建立被测电路的故障信息数据库，从而建立被测电路的DES模型，进行后续的处理分析。实验证明，用Multisim2001软件对电路进行故障仿真效果良好。更多还原

【Abstract】 With the development of the microprocessor technology, especially the micro-electronic technology, the complexity of the circuit system and the density of PCB have increased greatly. This made the test of the circuits more difficult. At the same time, the wide application of the mixed-signal circuits gave a great challenge for the present test methods. The testability of the mixed-signal circuits has become an important research task. This dissertation has researched on applying the recently developed Discrete Event System (DES) theory to analyze the testability of the mixed-signal circuits and provided a systemic method for the digital circuits and the analog circuits.The main work and contributions of the dissertation are summarized as follows:Firstly, We researched the mathematics model of mixed-signal circuits based on the DES theory systemically. It was proved that the model was feasible to deal with the fault diagnosis and the testability of the digital and analog parts in the circuits with an uniform frame.Secondly, When we researched the mixed-signal circuits based on the DES theory, one of the important tasks was to find the minimal test set of the circuit in order to reduce the test time and the test cost. In the dissertation we regarded it as an optimization problem and proposed to solve it based on the hybrid strategy of the genetic algorithm and simulated annealing algorithm. We programmed the algorithm and got many solutions at one time.Finally, as for building the DES model of the circuits to be tested, we introduced the EDA tool, Multisim2001, to inject the fault to the circuit, simulate the fault and build the fault information database. The experiment proved the fault simulation method based on Multisim2001 was effective.更多还原