【作者】 黄韵；

【导师】 裴昌幸； 朱志祥；

【作者基本信息】 西安电子科技大学 ， 通信与信息系统， 2004， 硕士

【摘要】 多点控制单元MCU是IP网络视频会议系统中的重要控制部件，其性能优劣直接影响视频会议系统的质量。MCU的容量，即MCU最多能接纳的视频会议终端的数目，是衡量MCU性能好坏的一个重要参数。但由于MCU的容量受多种因素的影响，不易用公式推导。而且到目前为止，业界内也没有公开的简单易行的方法来测试MCU的容量。本论文就是针对这个问题，提出了一种测试MCU容量的方案。 本文分析研究了MCU达到其容量的过程以及影响MCU容量的一些因素，探讨了用公式推导MCU的容量和实际测试MCU的容量的难度，在此基础上，提出了一种简便的测试MCU容量的方法，即设计了一个测试设备，利用该测试设备模拟MCU达到其容量的过程，从而测出其容量。文中，重点介绍了测试设备的设计和实现，以及利用该测试设备测试MCU容量时的具体步骤。 本论文所提出的方案解决了MCU容量的测试问题，它打破了传统的MCU性能测试的方法，是一种全新的针对MCU容量测试而设计的方案。该方案简单易行，且耗费经济成本低，占用资源少，降低了MCU容量测试的难度，具有很大的实用性。而本文中所设计的测试设备程序已经在实验室环境之中运行测试通过，用实践证明了本文所设计的MCU容量测试方案原理的正确性和可行性。到目前为止，在业界内未发现有类似的测试设备及类似的简单易行的测试MCU容量的方法。更多还原

【Abstract】 Multimedia Control Unit(MCU) is an important control component in Ip video conference. Its performance directly influences the quality of the video conference. Capacity is a key parameter used to measure how good the MCU is. But there is no formula that can deduce the capacity of MCU because its capacity is influenced by many factors. Neither is there an open and simple method to test the capacity of MCU in this field. To solve this problem, a new scheme to test the capacity of MCU is put forward in this paper.In this paper the process how MCU achieves its capacity is presented in detail,as well as a few factors influencing the capacity of MCU. And after the difficulty of finding the capacity by formula and by testing is discussed, a new scheme designed to test the capacity of MCU is put forward.The emphasis is put on the design and implementation of a test device used to test the capacity of MCU and on the detailed steps performed in the scheme.The scheme discussed in this paper solves this problem. It is a new method to test the capacity of MCU, which breaks the conventional one. This scheme is not only simple and feasible, but consumes less money and fewer resources, which reduce the difficulty of testing to the least. So this scheme has high practicability. The test device designed in this scheme to test the capacity of MCU has passed the test in experimental environment. Practice has proved the correctness and feasibility of the scheme principle for the capacity test of MCU designed in this paper. So far, in this field, no device or method analogous to the ones introduced in this paper have been found.更多还原