【作者】 章其波；

【导师】 鲁昌华；

【作者基本信息】 合肥工业大学 ， 信号与信息处理， 2003， 硕士

【摘要】 随着科学技术特别是微电子技术的迅猛发展，电路的规模和复杂性都急剧上升。工业过程的模拟特性和微芯片的使用，使得数模混合电路的应用有着巨大的空间。数模混合电路在设计和测试中的可测试性问题成为一个迫切的研究课题。近年来出现的DES理论为数模混合电路的可测试性提供一种的系统化的处理方法。本文在DES理论的框架下对数模混合电路可测试性中的几个关键问题进行研究，并针对最小测试集的求取算法进行了理论上的探讨。 本文的主要工作如下： (1)对数模混合电路的数学模型进行了研究，并对其可行性进行了验证。这样使得数字和模拟电路能够在一个统一的数学框架中进行可测试性分析和后续处理。 (2)编写了一套基于DES理论的电路测试的演示软件，实现了对被测电路的可测试性判断、故障覆盖率和最小测试集求取的算法，能够实现对电路测试的各项功能。 (3)以可编程逻辑器件为核心进行了一些典型数字电路的故障模拟仿真试验，并建立相应的电路故障测试集数据库，为这些电路的可测试性研究提供数据。 (4)针对目前电路最小测试集求取算法的一些不足，提出了一种利用模拟退火策略的组合优化的算法，并对这种算法进行了一些理论上的探讨。更多还原

【Abstract】 With the development of Science and Technology, especially theMicro-electronic technology, the complexities of the circuits have increased. Owing to the analogue nature of many industrial processes and the increasing use of microprocessor techniques, there have been a vast room for the application of mixed-signal (digital and analogue) circuits, and the research for the test on mixed-signal circuit became imminent. The DBS theory that is developed in the recent years gave a systemic method for the mixed-signal circuits test and fault-diagnosis. This paper has researched on the DBS theory’s application in the testability of mixed-signal circuit on the basis of the study of DES theory.The main works as follow:(1) We researched the mathematics model of mixed-signal circuits based on the DES theory and it is feasible to deal with the fault diagnosis and the testability of the digital and analog parts in the circuits with an uniform math frame.(2) We programmed a demo’s software on Microsoft Visual C++ 6.0 for implementing the algorithms to judge the testability, get the minimum test set and take the fault efficiency of the circuits. The software successfully realizes these functions.(3) We put up the experiments for the faults emulation on some digital signal circuits. These experiments were mainly based on the CPLD/FPGA and we built the testing faulty databases according to these circuits.(4) This paper puts forward a new algorithm based on the Simulated Annealing thoughts for the minimum test set of circuits. This algorithm has tried to ameliorate the weaknesses of the former algorithm based on the greed strategy. Then we discuss some parts of this algorithm in theory.更多还原