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数模混合电路的故障诊断及可测性研究

The Research of the Fault Detection and the Testability of Mixed-signal Circuits

【作者】 蒋薇薇

【导师】 鲁昌华;

【作者基本信息】 合肥工业大学 , 信号与信息处理, 2003, 硕士

【摘要】 随着科学技术尤其是微电子技术的发展,LSI,VLSI的电路密度不断增加,集成电路的测试难度越来越大,而数模混合电路的应用更使测试难度增大。数模混合电路的可测性分析及故障诊断一直是个难点,也是电子系统集成技术的重点研究方向之一,急需运用新的理论来解决此问题。本论文利用近年来发展的离散事件系统理论寻找一种统一的对数字和模拟电路测试都有效的故障诊断和可测性分析方法。 本文所做主要工作如下: 1、本文利用DES理论对数模混合电路进行数学建模,将电路状态离散化,从而将电路的数字部分和模拟部分统一起来进行故障诊断和可测性分析。 2、以CPLD为核心进行了一些典型数字电路的故障模拟仿真试验,建立被测电路的状态转移函数集,为进一步研究电路的可测试性和故障诊断提供了数据。 3、利用Borland C++ Builder语言编写了一套电路测试与诊断演示软件,能够实现对特定电路的可测性判断、故障覆盖率、快速测试和故障诊断等各项功能。 4、重点研究了利用图论中的基本回路概念根据状态转移函数集寻找电路的最小测试集,然后利用所得的最小测试集建立相应电路的快速测试数据库和故障诊断字典。

【Abstract】 With the development of technology, especially micro-electronics, the density of LSK VLSI are increasing. This made the test of ICs more difficult, and the application of digital and analog mixed-signal circuits made the test much more difficult. The research of the testability and the fault detection of mixed-signal circuits is always a difficulty, and it is also one of the important research aspects. We should use new methods to solve this problem. A recently developed theory of discrete event system provides a uniform and effective treatment for digital and analog circuits.The main works are as follows:1) We made the mathematics model of mixed-signal circuits based on the DES theory to make the circuit states discrete. So we can unite the digital part and the analog part of the circuit to research the testability and the fault detection.2) We put up the experiments mainly based on the CPLD for the faults emulation on some typical digital circuits. And we built the transition function databases according to the faulty testing results.3) We programmed a demo’s software of circuits’ test and fault diagnosis on Borland C++ Builder. This software can realize these functions, such as judging the testability, getting the minimum test set, testing circuit quickly and making a fault diagnosis.4) In this paper, according to the transition function databases we got the minimum test set using the graph theory. And later we built the quick test databases and the fault diagnosis databases.

  • 【分类号】TN407
  • 【下载频次】358
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