节点文献
嵌入式系统在SPI FLASH存储器测试中的应用
Embedded System in SPIFLASH Memory Test Application
【作者】 陈凝；
【作者基本信息】 北方工业大学 ， 控制工程， 2012， 硕士
【摘要】 本课题首先对半导体器件的测试概念进行了介绍,从半导体测试系统的种类及其自动测试系统设备和SPI FLASH存储器测试方法三个方面入手分别对存储器测试系统、模拟器件测试系统、混合信号测试系统、数字信号测试系统、测试设备内部结构、测试通道、存储器结构及器件的DC测试、AC测试及功能测试等方面进行了详细研究和讨论。在国外测试技术的垄断下,半导体测试成本几乎占据了整个芯片制造成本的一半,为了满足企业对成本控制的需要,研究和设计出一种成本低廉,测试性能可靠的软硬件测试平台显得尤为重要。根据对国内外现有的半导体测试机台已有技术及嵌入式系统软硬件技术的研究,进行了基于模块化PMU芯片AD5522及快速ADC芯片AD7685构成的DC参数测试模块的电路设计。并基于ARM技术及嵌入式实时系统设计实现了测试控制板及简易分选器的控制硬软件,最后根据FLASH的失效模式分析总结归纳出FLASH的失效模型,根据失效模型建立和讨论了FLASH的功能测试算法。
【Abstract】 The subject of the first test of the concept of semiconductor devices are described, from the type of semiconductor test systems and automatic test system equipment and SPI FLASH memory and test methods were three aspects to start the memory test system, test system analog, mixed-signal test systems, digital signal test system, the internal structure of test equipment, test channel, memory structures and devices of DC testing, AC testing and functional testing and other aspects of the detailed study and discussion. The monopoly of foreign technology in the next test, semiconductor test costs accounted for almost half the cost of the entire chip, in order to satisfy the need for cost control, research and design a low-cost, reliable hardware and software test platform is particularly important to test. Based on existing domestic and international semiconductor test machine has embedded software and hardware technology and technology research, the PMU chip based on modular and fast ADC AD5522AD7685chip module consisting of DC parametric test circuit design. Based on ARM technology and embedded real-time systems design and implementation of the test panel and easy separation of the control hardware and software, the final failure mode analysis based on the FLASH FLASH summarized the failure model, based on model building and discussed the failure of FLASH function test algorithm.