【作者】 谢楠；

【导师】 张进成； 钟征宇；

【作者基本信息】 西安电子科技大学 ， 软件工程， 2011， 硕士

【摘要】 近年来可编程门阵列(FPGA)以其高集成度、可编程等优点在宇航体系中的应用越来越广泛,应用于该领域的FPGA主要有SRAM型、Flash型和反熔丝型。但同时空间中以单粒子效应为代表的辐射效应也对FPGA可靠性造成了严重威胁。本文主要针对宇航用FPGA,特别是基于SRAM的FPGA的单粒子效应展开研究。首先讨论了单粒子效应的原理以及各类单粒子效应的形成机制。同时在掌握空间环境特点和各类单粒子效应的机理的基础上,主要针对宇航用基于SRAM型FPGA的内部结构及可能出现的单粒子事件展开分析。发现单粒子翻转和单粒子功能中止会影响到FPGA的多个模块,对整个器件可靠性影响巨大,需要着重考虑。本文另外一个关键点是如何监测宇航用FPGA中的单粒子事件。在调研大量国外资料的基础上,结合试验原理及试验数据讨论了内建自测试、瞬态激光测试、重离子试验和质子试验四类主要的单粒子试验和监测方法。其中重离子试验是一种最贴近实际的也是在国内外使用率较高的试验方法,本文对其做了着重研究,对其静态测试、动态测试以及功能中止测试方面研究了具体的测试方法。此外,本文还研究了FPGA单粒子地面模拟试验中的试验监测数据处理方法。更多还原

【Abstract】 In recent years, field-programmable gate arrays (FPGAs) have being used more and more widely in aerospace applications for the advantages of high integration and programmable. There are mainly three types of FPGA in this field, they are SRAM-based FPGA, Flash-based FPGA and anti-fuse based FPGA. While at the same time, space radiation represented by single event effects (SEEs) make serious threats to the reliability of these FPGAs.This paper developed a research for aerospace FPGAs,SRAM-based FPGA in particular,on single event effects(SEEs). All at first, the basic principle of SEEs and a variety of the formation mechanisms of SEEs were studied. After well known the characteristics of space environment and basis mechanism of kinds of SEEs, a search was developed mainly for the internal structure and the possibility of SEEs in SRAM-based FPGAs. It is found that single-event upset(SEU) and single-event functional interrupt (SEFI) can affect many FPGA modules, and they are very important parts of consideration of devicesAnother key point of this paper is how to monitor the SEEs in FPGA. Through learning a large number of foreigner literatures, this paper summarizes the approaches of the built-in self test, the laser test, heavy ion and proton test. Heavy ion test is one of the closest one to the actual usage, and it is also the domestic method at home and abroad. So this paper also focus on the test data processing methods of the corresponding research in FPGA SEEs ground simulation tests .更多还原