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基于AVO效应的薄层预测方法研究

Research on The Thin-layer Prediction Method Based on the AVO Effect

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【作者】 王云专兰金涛于舒杰

【Author】 WANG Yun-zhuan,LAN Jin-tao1,YU Shu-jie (College of Earth Sciences,Northeast Petroleum University Daqing 163318,P.R.China;NO.1 Geophysical Exploration Branch Company1 of Daqing Drilling Engineering Company,Daqing 163357,P.R.China)

【机构】 东北石油大学地球科学学院大庆钻探工程公司物探一公司

【摘要】 通过地震波波峰和波谷间的距离预测薄层厚度,其垂直分辨率是1/8波长。为利用地震资料对更薄地层厚度进行预测,设计反射系数相同和相反的两种楔形模型。同时设计多个厚度不同的CDP道集,利用地层反射系数随炮检距的变化而变化的特点在CDP道集上分辨薄层。通过S变换时频分析方法提取CDP道集的单频剖面,扫描单频剖面的极值点,利用极值点间的垂直距离来预测薄层厚度。通过模型试验表明这种算法对1/16波长厚度的薄层预测效果依然准确,说明这种方法是有效的。

【Abstract】 The prediction of thin layer thickness vertical resolution is 1 / 8 wavelength by the distance between seismic wave peaks and troughs.For the use of seismic data to predict the thickness of the layer of thinner,design two wedge-shaped model that the reflection coefficient are same and opposite.While several different CDP gathers are designed that have different layer thicknesses,useing the characteristic that the reflection coefficient change with offset thin layer are distinguished.Through the S-transform time-frequency analysis method to extract the single-frequency CDP gathers,scanning the extreme points of the single-frequency profile,using the vertical distance between the extreme points the thickness of thin layer can be predicted.By model tests showed that this method is still acurate even the thin layer thickness is 1/16 wavelength,so this method is effective.

【关键词】 S变换时频分析薄层
【Key words】 S transform time-frequency analysis thin bed
【基金】 黑龙江省教育厅科学技术研究项目(12511018)资助
  • 【文献出处】 科学技术与工程 ,Science Technology and Engineering , 编辑部邮箱 ,2012年06期
  • 【分类号】P631.42
  • 【被引频次】2
  • 【下载频次】125
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