【摘要】 【目的】明确截形叶螨Tetranychus truncatus Ehara对阿维·哒螨灵药剂的抗性遗传方式,为今后合理使用药剂,有效地制定害螨抗性治理策略提供一定的理论指导。【方法】通过杂交和回交试验,确定截形叶螨抗阿维·哒螨灵种群的显性度(D)、细胞质影响因子和遗传基因。【结果】所测得的截形叶螨抗性种群的杂交F1代(SS♀?RR♂和RR♀SS♂)的显性度D值分别为0.625和0.802,均在0 <D <1范围内,表明抗性都由不完全显性基因控制;两个D值(DSR和DRS)95%置信限有重叠,并且经t-检验,两个D值不存在显著差异(P>0.05),证明截形叶螨对阿维·哒螨灵的抗性遗传受母体或核外效应的影响不大,其抗性基因在常染色体上;回交F2代两个种群的(BC1SR和BC1RS)的实际死亡率和期望值经χ2检验,均差异显著,证实由多基因控制。【结论】不完全显性多基因控制的遗传方式产生的抗谱很宽,抗性一旦产生则很难延缓其抗性的迅速发展,因此田间应用该药剂时应交替轮换不同作用机制的药剂,重点采用预防性抗性治理策略。更多还原

【Abstract】 [Objectives] To clarify the inheritance of resistance to avermectin+pyridaben in Tetranychus truncatus Ehara.[Methods] Resistant(RR)and susceptible(SS) strains of Tetranychus truncatus Ehara were crossed and backcrossed to investigate the genes involved in resistance to avermectin+pyridaben, their dominance(D) and cytoplasmic factors involved in resistance. [Results] D values for F1 females from SS♀?RR♂ crosses and RR♀?SS♂ crosses were in the range of 0 < D < 1(0.625 and 0.802, respectively), indicating incomplete dominance. The 95% confidence limits of these two D values overlap,indicating that there is no significant difference between DSR and DRS. This reveals that the gene responsible for resistance is located in the autosome. A Chi-square(χ2) goodness-of-fit analysis indicated that mortality levels in F2 females(BC1 SR and BC1 RS) were significantly different(χ2= 16.92, df = 9, P < 0.05) from the expected values for multiple gene control.[Conclusion] The inheritance of resistance to abamectin+pyridaben in T. truncatus can easily cause a wide spectrum of resistance that is difficult to reduce. Consequently, abamectin+pyridaben should be used in rotation with the other insecticides to reduce selection for resistance to this combination of insecticides. It’s important to implement a preventive resistance management strategy and measures to manage resistance to abamectin+pyridaben.更多还原