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基于线阵CCD的尺寸测量研究
Study on line array CCD used in dimension measurement
【摘要】 在当今国内工业中对尺寸的测量大多还是采用千分尺等落后的接触式的方法,不但效率不高而且精确度不高。文中讨论了线阵CCD用于尺寸测量的非常有效的非接触检测技术。本测量系统是以89C2051、TCD1206UD和ICL7135等芯片构成的,完成了由照明、成像、数据处理到显示等过程。本设计具有稳定可靠、测量精度高等特点,适用于各种高灵敏、高精度的检测。此外,本系统包括了LED显示,不仅价格便宜,而且测量结果方便可见,增加了本设计的实用性。
【Abstract】 In the domestic industry,methods in the measuring the dimension,a contact measurement with micro meter is backward which is not only imprecise but also inefficient.The non-contact technology of Line Array CCD used in dimension measurement is very effective.This measurement system is composed of 89C2051 chip,TCD1206UD chip,and ICL7135 chip.It has finished the process of illumination,imaging,data processing and display.The design has the characteristics of dependable and precision measurement.It is suitable for various high responsive and high accuracy tests.In addition,this system including the display is not only cheap but also measurements convenient which increasing it’s practical applications.
- 【文献出处】 电子设计工程 ,Electronic Design Engineering , 编辑部邮箱 ,2012年04期
- 【分类号】TP274
- 【被引频次】2
- 【下载频次】221