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基于Marr小波分析的薄层超声检测
Ultrasonic Testing of Thin Layered Structure Based on Marr Wavelet Analysis
【摘要】 薄层结构超声测厚过程中,薄层上下界面回波叠加导致信号难以区分。针对该难点本研究采用基于Marr小波的小波变换模极大值法对250~350μm的ZrO2陶瓷涂层进行了厚度测量。所得结果与金相法测量结果相符。
【Abstract】 It is difficult to recognize the overlapping signal of the front and bottom echoes from the thin layer structure. In order to measure the thickness of the thin layer, wavelet transform modulus maxima method based on Marr wavelet is utilized for the ZrO2 ceramic coating with the thickness ranging from 250μm to 350μm.The results of ultrasonic method accords with that of metallographical results.
【关键词】 Marr小波;
小波变换模极大值;
薄层测厚;
超声检测;
【Key words】 Marr wavelet; wavelet transform modulus maxima; thin layer depth measuring; ultrasonic testing;
【Key words】 Marr wavelet; wavelet transform modulus maxima; thin layer depth measuring; ultrasonic testing;
【基金】 国家自然科学基金资助项目(50401021)
- 【文献出处】 材料工程 ,Journal of Materials Engineering , 编辑部邮箱 ,2007年02期
- 【分类号】TG115.28
- 【被引频次】7
- 【下载频次】310