【作者】 邓爱民；

【导师】 温熙森；

【作者基本信息】 国防科学技术大学 ， 机械电子工程， 2006， 博士

【摘要】 随着科学技术的发展和设计、制造水平的大幅度提高,高可靠长寿命产品在军事、航空航天、电子工业、通信等领域应用越来越广泛,如何保障其可靠性与预测其寿命是值得深入研究的重要问题。本论文围绕高可靠长寿命产品可靠性研究中需要解决的关键技术与方法,在可靠性建模分析、可靠性评估、可靠性增长等方面进行了系统、深入的研究,主要研究内容与结论包括:1、在传统可靠性建模分析方法基础上,对高可靠长寿命产品退化失效模式进行了研究,提出了基于硬、软故障竞争失效模式的可靠性建模分析方法。基于该方法,分析了某高可靠长寿命航天机电产品的可靠性、失效率及平均故障时间与失效阈值的关系。研究结果表明,这种建模分析方法更加符合高可靠长寿命产品的失效规律,有助于优化产品的可靠性设计。2、分析了性能退化数据的特点,在寿命试验数据统计分析方法的基础上,提出了基于伪失效寿命的退化数据可靠性评估方法;分析了产品性能退化量分布随时间的变化规律,提出了基于性能退化量分布的退化数据可靠性评估方法。采用这两种方法,对高可靠长寿命GaAs激光器的可靠性进行了评估。研究表明,性能退化数据包含大量高可靠长寿命产品的可靠性信息,在寿命试验与加速寿命试验无法获得失效数据的情况下,利用性能退化数据可以有效地对高可靠长寿命产品进行可靠性评估与寿命预测。3、分析了加速退化数据的特点,总结了加速退化试验退化过程的加速性条件和常用的加速方程。将加速方程引入到加速退化试验数据的处理中,提出了基于伪失效寿命的加速退化试验数据可靠性评估方法;提出了基于退化量分布的加速退化试验数据可靠性评估方法。基于这两种方法,对高可靠长寿命碳膜电阻器的可靠性进行了评估。研究表明,对于性能退化十分缓慢的高可靠长寿命产品,可以利用加速退化试验的方法来评估产品可靠性并预测其寿命。4、研究了高可靠长寿命产品基于可靠性强化试验的可靠性增长关键技术,给出了可靠性强化试验的应用流程和剖面制定准则,提出了利用常规试验设备完成部分可靠性强化试验内容的方法,并将上述方法应用于我国新研制的××卫星有效载荷的可靠性增长研究。研究结果表明,对于高可靠长寿命产品,可靠性强化试验可以在短期内激发其潜在缺陷,大幅缩短产品可靠性增长所需时间,节省试验费用。总之,本文在高可靠长寿命产品可靠性保障与寿命预测应用需求的牵引下,通过理论分析,深化了对高可靠长寿命产品失效过程的认识,系统地研究了如何分析其可靠性、评估其可靠性、增长其可靠性等相关理论和技术问题。本文的研究成果,对于解决高可靠长寿命产品的可靠性保障和寿命预测问题具有一定的理论意义和工程价值。更多还原

【Abstract】 With the development of science and technology, the increasing improvement of manufacture techniques, the high-reliability & long-lifetime products are commonly used in such fields as Military, Astronautics & Aeronautics, Electronic industries and Communications. The problem of how to enhance their reliability and forecast their lifetime have become an important question deserving an in-depth study. This dissertation mainly carries on a systemic research on the key technologies and methods of high-reliability & long-lifetime products’ reliability engineering, include reliability modeling analysis, reliability assessment and reliability growth. The main contributions of this dissertation are summarized as follows:1. Based on traditional reliability analysis methods, the degradation failure modes of high-reliability & long-lifetime products are investigated, the reliability modeling analysis method based on competing mode of hard and soft failure is presented. The relations between reliability, failure rate, MTBF and failure threshold are analyzed by this method. The results reveal that this modeling analysis method adheres to the rules of products’ failure, and can help to optimize product reliability design.2. The characteristics of performance degradation data are analyzed. Based on statistical analysis methods for life test data, the reliability assessment methods with performance degradation data based on pseud-failure lifetime is presented. The disciplinarians of product performance degradation data with time are analyzed, the reliability assessment methods with performance degradation data based on performance degradation distribution is presented. These methods of reliability assessment are respectively applied to evaluating reliability of GaAs lasers. The application shows that performance degradation data contain abundant product reliability information, the reliability and lifetime of the high-reliability & long-lifetime products can be evaluated with performance degradation data availably, even if the failure time cannot be obtained by life testing(LT) or accelerated life testing(ALT).3. The characteristics of accelerated degradation data are analyzed, and the accelerative condition and common accelerated equations of accelerated degradation process are summarized. Introducing accelerated equations into analysis of accelerated degradation testing(ADT) data, the reliability assessment methods with accelerated degradation data based on pseud-failure lifetime is presented, and the reliability assessment methods with accelerated degradation data based on performance degradation distribution is presented. These methods based on ADT data are respectively applied to evaluating reliability of carbon-film resistors. The application shows that the ADT methods can be applied to evaluate reliability and forecast lifetime even when the performance degradation process of high-reliability & long-lifetime product is quite slow. 4. The key technologies of reliability growth methods based on reliability enhancement testing(RET) are studied, the principles of RET’s profiles and the steps of RET are summarized. The method that utilizes traditional test equipments to accomplish partial content of RET is presented. The RET methods are applied to××satellite payload, and the test results are carefully analyzed, the methods of improving on this product’s design are presented. The test results indicate that RET can effectively stimulate potential defaults of typical high-reliability & long-lifetime products such as××satellite payload, and RET is an effective method which can improve reliability of high-reliability & long-lifetime products quickly.In summary, the dissertation has deepened the understanding of failure process of high-reliability & long-lifetime products by theory analysis and resolved the questions of how to analyze their reliability, assess their reliability, forecast their lifetime, enhancement their reliability. These research results are meaningful for the application of reliability assurance and lifetime forecast of high-reliability & long-lifetime products.更多还原